Different microstructure and dielectric properties of Ba1−xCaxTiO3 ceramics and pulsed-laser-ablated films

A comparative study of the microstructure and dielectric properties between Ba1−xCaxTiO3 (BCT) ceramics and films were performed in the whole Ca concentration range of x = 0–1. The ceramics were prepared by conventional solid-state reaction technique and the films by the method of pulsed-laser deposition. X-ray diffraction (XRD) study of the BCT ceramics exhibited a pure tetragonal phase for x = 0–0.25, a tetragonal–orthorhombic diphase for x = 0.25–0.85 and a pure orthorhombic phase for x = 0.90–1.00. And the dielectric phase transition temperature from tetragonal to cubic was marginally affected by the Ca doping into BaTiO3. However, BCT films deposited on Pt/Si/SiO2/Si substrates showed a different microstructure and dielectric properties. Tetragonal–orthorhombic diphase was not found in the BCT films for x = 0.25–0.85, and a large decrease of the Curie point and diffuse phase transition were observed in the BCT films. Based on the compositional analysis, such phenomena were ascribed to the occupancy of some Ca2+ to the Ti4+ sites in the BCT films.