Title of article
Preparation and characterization of germanium oxysulfide glassy films for optics
Author/Authors
Maurel، نويسنده , , C. and Cardinal، نويسنده , , T. and Vinatier، نويسنده , , P. J. Petit، نويسنده , , L. and Richardson، نويسنده , , K. and Carlie، نويسنده , , N. and Guillen، نويسنده , , F. and Lahaye، نويسنده , , M. and Couzi، نويسنده , , M. and Adamietz، نويسنده , , F. and Rodriguez، نويسنده , , V. and Lagugné-Labarthet، نويسنده , , F. and Nazabal، نويسنده , , V. and Royon، نويسنده , , A. and Canioni، نويسنده , , L.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2008
Pages
9
From page
1179
To page
1187
Abstract
Homogeneous amorphous films in the GeS2–GeO2 system have been deposited by a rf sputtering technique. Optical characterizations have shown that the cut-off wavelength and the linear indices increase with an increase in the S/O ratio. Raman spectroscopy indicates the presence of new modes that can be assigned to intermediate germanium oxysulfide structural units. Photo-sensitivity of the oxysulfide films has been demonstrated for irradiation near the band-gap. Diffraction gratings inscribed using 488 nm exposure displayed a limited diffraction efficiency (≤3%) that weakens with a corresponding decrease in the glass S/O ratio.
Keywords
C. Raman spectroscopy , A. Glasses , D. Optical properties , A. Thin films
Journal title
Materials Research Bulletin
Serial Year
2008
Journal title
Materials Research Bulletin
Record number
2098821
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