• Title of article

    Roughness-based monitoring of transparency and conductivity in boron-doped ZnO thin films prepared by spray pyrolysis

  • Author/Authors

    Gaikwad، نويسنده , , Rajendra S. and Bhande، نويسنده , , Sambhaji S. and Mane، نويسنده , , Rajaram S. and Pawar، نويسنده , , Bhagwat N. and Gaikwad، نويسنده , , Sanjay L. and Han، نويسنده , , Sung-Hwan and Joo، نويسنده , , Oh-Shim، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2012
  • Pages
    6
  • From page
    4257
  • To page
    4262
  • Abstract
    Sprayed polycrystalline ZnO and boron-doped ZnO thin films composed of spherical grains of 25–32 nm in diameters are used in roughness measurement and further correlated with the transparency and the conductivity characteristics. The surface roughness is increased up to Zn0.98B0.02O and then declined at higher boron concentrations. The sprayed ZnO films revealed ≥95% transmittance in the visible wavelength range, 1.956 × 10−4 Ω cm electrical resistivity, 46 cm2/V s Hall mobility and 9.21 × 1021 cm−3 charge carrier concentration. The X-ray photoelectron spectroscopy study has confirmed 0.15 eV binding energy change for Zn 2p3/2 when 2 at% boron content is mixed without altering electro-optical properties substantially. Finally, using soft modeling importance of these textured ZnO over non-textured films for enhancing the solar cells performance is explored.
  • Keywords
    A. Thin films , A. Optical materials , C. X-ray diffraction , B. Chemical synthesis
  • Journal title
    Materials Research Bulletin
  • Serial Year
    2012
  • Journal title
    Materials Research Bulletin
  • Record number

    2102861