Title of article
Gas permeabilities in thermally grown silicon dioxide films
Author/Authors
Li، نويسنده , , Yong-Long and Pinto، نويسنده , , Neville G. and Thurmon Henderson، نويسنده , , H. and Hwang، نويسنده , , Sun-Tak and Nguyen، نويسنده , , Phu، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1995
Pages
6
From page
63
To page
68
Abstract
The permeability characteristics of six gases, argon, helium, oxygen, nitrogen, carbon dioxide and hydrogen, in thermally grown silicon dioxide films have been evaluated. By studying the dependence of permeabilities on temperature, pressure and molecular weigth, it has been established that the controlling mechanism of transport is viscous flow through micropores. This implies, contrary to what is commonly assumed, that gas permeabilities in thermally grown silicon dioxide films decreases with an increase in temperature, and suggests that annealing temperatures should be low for favorable gas fluxes.
Keywords
Silicon oxide , diffusion , Oxygen , Thin films
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Serial Year
1995
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Record number
2131091
Link To Document