Title of article
SEM CL studies on polar glide dislocations in CdTe
Author/Authors
Uniewski، نويسنده , , Rajendra H. and Schreiber، نويسنده , , Neil J. and Hildebrandt، نويسنده , , S. and Leipner، نويسنده , , H.S.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1996
Pages
5
From page
284
To page
288
Abstract
Defects in CdTe generated by micro-indentation are studied by cathodoluminescence scanning microscopy. At low temperatures (T < 100 K) a localized luminescence with peak energy at 1.48 eV is observed. A model for the dislocation distribution on ±(111), (110) and (100) surfaces is presented. By analyzing the dislocation rosettes on these surfaces the defect bound luminescence can be related to Te(g) dislocations. The polarity of the glide dislocations is established by studying the depth distribution of Te(g) dislocations on ()Te oriented samples.
Keywords
Defect induced luminescence , X-ray diffraction , CL studies
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Serial Year
1996
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Record number
2131959
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