Title of article
Scanning probe microscopy of GaAs/AlGaAs superlattices
Author/Authors
Fedirko، نويسنده , , V.A. and Eremtchenko، نويسنده , , M.D.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1997
Pages
3
From page
110
To page
112
Abstract
A GaAs/AlGaAs superlattice is investigated by means of scanning probe microscopy (SPM). The periodic structure is very well distinguished at the edge of a cleaved sample by scanning tunnelling and atomic force microscopy (AFM) techniques in air. Images resulting from different SPM operation modes are compared. Spatial Fourier-transform analysis is applied to determine the period of the superlattice. The results are in good agreement with those obtained by other methods.
Keywords
superlattices , Scanning probe microscopy
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Serial Year
1997
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Record number
2132166
Link To Document