X-ray diffraction and electron microscopic studies on selenium substituted indium intercalation compounds of tungsten disulphide

Selenium substituted indium intercalation compounds of tungsten disulphide, In1/3WS2−xSex (0≤x≤2) have been studied for microstructural characterization using X-ray line profile analysis to find out information about crystallite size, r.m.s. strain, dislocation density, variability of interlayer spacing, fraction of planes affected by such defects, stacking fault probability, crystallite size anisotropy etc. Scanning electron microscopic (SEM) and scanning tunneling microscopic (STM) studies are also reported herewith. These results have also been compared with respect to the pure WS2−xSex (0≤x≤2).