Title of article
Grazing-incidence small-angle X-ray scattering on nanosized vanadium oxide and V/Ce oxide films
Author/Authors
Turkovi?، نويسنده , , A. and Crnjak-Orel، نويسنده , , Z. and Dub?ek، نويسنده , , P.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
5
From page
11
To page
15
Abstract
Vanadium oxide and new V/Ce oxide films on glass substrate were obtained by sol–gel dip-coating process. The average grain radius, 〈R〉, obtained by grazing-incidence small-angle X-ray scattering for pure V2O5 was 7.49±1.06 nm. The average grain size 〈R〉 for mixed oxides depends on the atomic percent of V in the sample. The fractal nature of some of these samples is analyzed.
Keywords
Thin films , V/Ce-oxide , Nanocrystalline-materials structure , Grazing-incidence small-angle X-ray scattering , Small-angle scattering X-ray , dip-coating
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Serial Year
2001
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Record number
2136334
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