Title of article
Time-resolved high-resolution transmission electron microscopy and high-angle annular dark field scanning transmission electron microscopy of metal-mediated crystallization of amorphous germanium films
Author/Authors
Tanaka، نويسنده , , Nobuo and Kawahara، نويسنده , , Michiharu، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
6
From page
25
To page
30
Abstract
Metal mediated crystallization of amorphous germanium (a-Ge) films was studied through ‘in-situ’ heating by time-resolved high-resolution transmission electron microscopy (HRTEM) and high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM), mainly on a-Ge films with nanometer-sized gold clusters on the surfaces. It was revealed from the dynamic HRTEM observations that the interface between crystalline gold and a-Ge was a bit melted due to alloying even at 70°C and liquid-like gold-rich alloys migrate on the a-Ge films to initiate the crystallization, which was confirmed also through the static observations with HAADF-STEM.
Keywords
Fractal patterns , Melted gold clusters , High-angle annular dark field scanning transmission electron microscopy. , Amorphous germanium films , Metal-mediated crystallization , Time-resolved high-resolution transmission electron microscopy
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Serial Year
2001
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Record number
2140071
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