Title of article
Degradation phenomena due to dc bias in low-voltage ZnO varistors
Author/Authors
Zhou، نويسنده , , Dongxiang and Zhang، نويسنده , , Congchun and Gong، نويسنده , , Shuping، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
4
From page
412
To page
415
Abstract
Relationship between the electrical characteristics of the low-voltage ZnO varistors and dc degradation is investigated in this study. The degradation phenomena of the low-voltage ZnO varistors due to long-time bias are studied by current–voltage (I–V) and ac measurements. After degradation, the changes observed in the properties of deep bulk trap are attributed to the alteration of defect structure.
Keywords
ZNO , Low-voltage varistor , Degradation , Trap states , Relaxation
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Serial Year
2003
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Record number
2140720
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