Title of article
Oxide precipitation in V-doped TiAl-based alloys
Author/Authors
Cao، نويسنده , , G.H and Liu، نويسنده , , Z.G. and Shen، نويسنده , , G.J. and Liu، نويسنده , , J.-M، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
4
From page
177
To page
180
Abstract
Oxide precipitation in V-doped TiAl-based alloys was studied by transmission electron microscopy (TEM). The experimental results showed that the interstitial oxygen in single-phase TiAl alloy precipitates in the form of oxide. A Ti–Al–O ternary oxide was observed and the structure of the precipitated oxide was determined. However, in two-phase TiAl/Ti3Al alloy no oxide was observed. The reasons responsible for the fact that oxide precipitates in TiAl-based alloys were discussed.
Keywords
Intermetallic compound , Transmission electron microscopy (TEM) , Precipitate
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Serial Year
2002
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Record number
2140722
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