Title of article
Study on electrical properties of CdS films prepared by chemical pyrolysis deposition
Author/Authors
Cha، نويسنده , , Deokjoon and Kim، نويسنده , , Sunmi and Huang، نويسنده , , N.K.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
6
From page
63
To page
68
Abstract
CdS films were prepared with chemical pyrolysis deposition (CPD) at different temperature followed by annealing. The results of microanalyses show that the prepared CdS films were dense and uniform and that their average grain sizes varied for different growth temperature. The CdS films deposited at 400–450 °C were poly-crystalline with wurtzite phase structure, and its lattice constants are: a=4.135 and c=6.713 Å. Hall measurements on electrical properties at room temperature show that resistivity, carrier density and mobility of the non-annealed CdS poly-crystalline films deposited at 400 °C were 1.48×104 Ω cm, 1.82×1011 cm−3 and 2.42×103 cm2/(V s), respectively. The electrical properties of CdS films can be improved by annealing at a certain temperature range if these films are used as optical windows for solar cell.
Keywords
CdS films , microanalysis , Electrical property
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Serial Year
2004
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Record number
2140867
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