Title of article
Relaxation of magnetization in thin composite (Co45Fe45Zr10)X(Al2O3)100−X films
Author/Authors
Kotov، نويسنده , , L.N. and Turkov، نويسنده , , V.K. and Vlasov، نويسنده , , V.S. and Kalinin، نويسنده , , Yu.E. and Sitnikov، نويسنده , , A.V. and Asadullin، نويسنده , , F.F.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
4
From page
352
To page
355
Abstract
This paper examines the specific electric resistance, magnetization, porosity, demagnetizing fields, and relaxation magnetization frequencies in composite (Co45Fe45Zr10)X(Al2O3)100−X films. A strong correlation between the ferromagnetic resonances (FMR) line width, the relaxation frequency, and specific resistance are observed. The FMR line shape for films with a small percentage of the metal phase transforms from a resonant line shape to a relaxation line shape as the temperature decreases or the film is annealed. This transition is connected to the changes in the metal–dielectric boundary properties.
Keywords
Magnetization relaxation , composite films , Ferromagnetic resonance
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Serial Year
2006
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Record number
2150494
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