Title of article
Microcreep of rapidly solidified Sn–0.7 wt.% Cu–In solder alloys
Author/Authors
Kamal، نويسنده , , Mustafa and El-Ashram، نويسنده , , Tarek، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2007
Pages
4
From page
1
To page
4
Abstract
Sn–Cu eutectic alloy rapidly solidified has excellent mechanical and electrical properties, which makes it a suitable candidate for replacement of Pb–Sn solder, however it needs more study. In this paper, we study the effect of indium additions on the properties of Sn–Cu eutectic alloy. In addition, we use the new technique, which has been developed by [Tarek El-Ashram, R.M. Shalaby, J. Electron. Mater., 34 (2005) 212–215.] to study the creep behavior of Sn–Cu–In alloys. The results showed that the hardness of Sn–Cu eutectic alloy was increased due to the addition of indium, however, the creep resistance was decreased, also Youngʹs modulus was decreased and the resistivity was increased.
Keywords
Rapid solidification , X-ray diffraction , resistivity , Youngיs modulus , Microhardness , Microcreep
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Serial Year
2007
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Record number
2152128
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