Interference experiments with energy filtered electrons

Interference of purely inelastically scattered electrons in the Gaussian image plane of an energy-filtering TEM (EFTEM) provides a means to measure the localisation of a specific inelastic scattering process. Although, the initial degree of angular coherence given by the illumination angle of the electron source is reduced by the inelastic scattering event, interference of single plasmon scattered electrons was observed in a Zeiss EM 912 OMEGA. The lower limit of the localisation of single plasmon scattering in an aluminium single crystal was measured in this experiment to be 16 nm. Present experimental restrictions are the limited degree of coherence of the LaB6 electron source and the fixed position of the Mِllenstedt-biprism along the beam of the Zeiss EM 912 OMEGA electron microscope.