Title of article
On the reliability of quantitative phase measurements by low magnification off-axis image plane electron holography
Author/Authors
Frost، نويسنده , , B.G. and Voelkl، نويسنده , , E، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 1998
Pages
7
From page
101
To page
107
Abstract
We experimentally found that the object wave function of an electron wave in a transmission electron microscope can depend on the diameter of the condenser aperture and on the excitation of the objective lens. This can be seen by low magnification holograms utilizing as sample electrically charged latex spheres of different diameters, the electric field at a pn-junction and the magnetic leakage field of a magnetic memory cell.
Keywords
Electron holography
Journal title
Ultramicroscopy
Serial Year
1998
Journal title
Ultramicroscopy
Record number
2154968
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