Title of article
Coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy
Author/Authors
Weeks، نويسنده , , Brandon L. and Barber، نويسنده , , Zoe H. and Raval، نويسنده , , Meera and Welland، نويسنده , , Mark E. and Rayment، نويسنده , , Trevor، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2001
Pages
5
From page
19
To page
23
Abstract
A novel application of coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy is introduced. Thermal drift is reduced in the Z-direction due to the low thermal expansion of silica. Virtually, any conducting material that can be evaporated or sputtered can be used as a tip material. Experimental results are shown for tips sputter coated with platinum, along with images obtained.
Keywords
Scanning tunneling microscopy , In situ studies , high temperature , STM
Journal title
Ultramicroscopy
Serial Year
2001
Journal title
Ultramicroscopy
Record number
2155610
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