Title of article
Field evaporation behaviour in the γ phase in Ti–Al during analysis in the tomographic atom probe
Author/Authors
Lefebvre، نويسنده , , W and Loiseau، نويسنده , , A and Menand، نويسنده , , A، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2002
Pages
11
From page
77
To page
87
Abstract
A Ti–48 at% Al alloy has been successfully investigated, using atom probe field ion microscopy and transmission electron microscopy. After a specific heat treatment, this alloy has a (α2+γ) lamellar microstructure. Using the tomographic atom probe (TAP), it has been possible to image the stacking of superlattice planes of γ and to identify titanium as the highest evaporation field element. In addition, the influence of analysis site on atom probe measurements has been estimated for this phase. A TAP analysis has also made it possible to observe an extremely thin step along a γ/γ interface at a near atomic scale.
Keywords
TiAl , Field ion microscopy , Interface , Lamellar structure , Atom probe , 3D atom probe , Chemical order , intermetallics
Journal title
Ultramicroscopy
Serial Year
2002
Journal title
Ultramicroscopy
Record number
2155781
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