• Title of article

    Field evaporation behaviour in the γ phase in Ti–Al during analysis in the tomographic atom probe

  • Author/Authors

    Lefebvre، نويسنده , , W and Loiseau، نويسنده , , A and Menand، نويسنده , , A، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 2002
  • Pages
    11
  • From page
    77
  • To page
    87
  • Abstract
    A Ti–48 at% Al alloy has been successfully investigated, using atom probe field ion microscopy and transmission electron microscopy. After a specific heat treatment, this alloy has a (α2+γ) lamellar microstructure. Using the tomographic atom probe (TAP), it has been possible to image the stacking of superlattice planes of γ and to identify titanium as the highest evaporation field element. In addition, the influence of analysis site on atom probe measurements has been estimated for this phase. A TAP analysis has also made it possible to observe an extremely thin step along a γ/γ interface at a near atomic scale.
  • Keywords
    TiAl , Field ion microscopy , Interface , Lamellar structure , Atom probe , 3D atom probe , Chemical order , intermetallics
  • Journal title
    Ultramicroscopy
  • Serial Year
    2002
  • Journal title
    Ultramicroscopy
  • Record number

    2155781