Title of article
Quantitative high-resolution HAADF–STEM analysis of inversion boundaries in Sb2O3-doped zinc oxide
Author/Authors
Yamazaki، نويسنده , , T and Nakanishi، نويسنده , , N and Re?nik، نويسنده , , A and Kawasaki، نويسنده , , M and Watanabe، نويسنده , , K and ?eh، نويسنده , , M and Shiojiri، نويسنده , , M، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2004
Pages
12
From page
305
To page
316
Abstract
Sb2O3-doped ZnO crystals including inversion boundaries were investigated by high-resolution high-angle annular-dark field (HAADF) scanning transmission electron microscopy (STEM). The images were analysed with the aid of the image simulation based on Bethe method and also the retrieval processing using deconvolution. Utility of these two approaches for the HAADF–STEM analysis is discussed.
Keywords
Sb2O3-doped ZnO , Bethe method , Deconvolution , HAADF , STEM
Journal title
Ultramicroscopy
Serial Year
2004
Journal title
Ultramicroscopy
Record number
2156329
Link To Document