Title of article
Electron channelling based crystallography
Author/Authors
Van Aert، نويسنده , , S. and Geuens، نويسنده , , P. and Van Dyck، نويسنده , , D. and Kisielowski، نويسنده , , C. and Jinschek، نويسنده , , J.R.، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2007
Pages
8
From page
551
To page
558
Abstract
Electron channelling occurs when the incident electron beam is parallel to the atom columns of an object, such as a crystal or a particular crystal defect. Then, the electrons are trapped in the electrostatic potential of an atom column in which they scatter dynamically. This picture provides physical insight and explains why a one-to-one correspondence is maintained between the exit wave and the projected structure, even in case of strong dynamical scattering. Moreover, the theory is very useful to invert the dynamical scattering, that is, to derive the projected structure from the exit wave. Finally, it can be used to determine the composition of an atom column with single atom sensitivity or to explain dynamical electron diffraction effects. In this paper, an overview of the channelling theory will be given together with some recent applications.
Keywords
Electron diffraction and elastic scattering theory , Reflection and scanning electron microscopy , Theories of diffraction and scattering , image simulation , Transmission
Journal title
Ultramicroscopy
Serial Year
2007
Journal title
Ultramicroscopy
Record number
2156917
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