Title of article
Microscopic tomography with ultra-HVEM and applications
Author/Authors
Takaoka، نويسنده , , Akio and Hasegawa، نويسنده , , Toshiaki and Yoshida، نويسنده , , Kiyokazu and Mori، نويسنده , , Hirotaro، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2008
Pages
9
From page
230
To page
238
Abstract
The ultra-HVEM with an accelerating voltage of 3 MV at Osaka University is capable of achieving excellent penetration and resolution for thick specimens. We obtained images of 5-μm-thick slices tilted at angles of up to 70° for biological samples and observed stick-shaped samples of Si devices free from missing zone. These features make the ultra-HVEM an invaluable extension of 3D observation by electron tomography. In this paper, we introduce aspects of ultra-HVEM tomography; specifically, the magnification, the amount of image blurring for thick samples and the electron staining method. Finally, we give some typical applications in the fields of cell biology, pathology and electrical engineering.
Keywords
Electron tomography , Ultrahigh voltage electron microscopy , 3D observation , Thick samples , HVEM
Journal title
Ultramicroscopy
Serial Year
2008
Journal title
Ultramicroscopy
Record number
2157106
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