• Title of article

    New approach for the dynamical simulation of CBED patterns in heavily strained specimens

  • Author/Authors

    Houdellier، نويسنده , , F. and Altibelli، نويسنده , , A. and Roucau، نويسنده , , C. and Casanove، نويسنده , , M.J.، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 2008
  • Pages
    7
  • From page
    426
  • To page
    432
  • Abstract
    A new method for the dynamical simulation of convergent beam electron diffraction (CBED) patterns is proposed. In this method, the three-dimensional stationary Schrِdinger equation is replaced by a two-dimensional time-dependent equation, in which the direction of propagation of the electron beam, variable z, stands as a time. We demonstrate that this approach is particularly well-suited for the calculation of the diffracted intensities in the case of a z-dependent crystal potential. The corresponding software has been developed and implemented for simulating CBED patterns of various specimens, from perfect crystals to heavily strained cross-sectional specimens. Evidence is given for the remarkable agreement between simulated and experimental patterns.
  • Keywords
    Convergent Beam Electron Diffraction , Strained layers , Dynamical theory of electron diffraction
  • Journal title
    Ultramicroscopy
  • Serial Year
    2008
  • Journal title
    Ultramicroscopy
  • Record number

    2157139