• Title of article

    AFM picking-up manipulation of the metaphase chromosome fragment by using the tweezers-type probe

  • Author/Authors

    Yamanaka، نويسنده , , Keiichiro and Saito، نويسنده , , Masato and Shichiri، نويسنده , , Motoharu and Sugiyama، نويسنده , , Sigeru and Takamura، نويسنده , , Yuzuru and Hashiguchi، نويسنده , , Gen and Tamiya، نويسنده , , Eiichi، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 2008
  • Pages
    8
  • From page
    847
  • To page
    854
  • Abstract
    We have studied the development of a new procedure based on atomic force microscopy (AFM) for the analysis of metaphase chromosome. The aim of this study was to obtain detailed information about the specific locations of genes on the metaphase chromosome. In this research, we performed the manipulation of the metaphase chromosome by using novel AFM probes to obtain chromosome fragments of a smaller size than the ones obtained using the conventional methods, such as glass microneedles. We could pick up the fragment of the metaphase chromosome dissected by the knife-edged probe by using our tweezers-type probe.
  • Keywords
    Tweezers-type AFM probe , Metaphase chromosome , AFM manipulation
  • Journal title
    Ultramicroscopy
  • Serial Year
    2008
  • Journal title
    Ultramicroscopy
  • Record number

    2157222