Title of article
Reply to comment by Maurice et al. in response to “Bragg’s Law Diffraction Simulations for Electron Backscatter Diffraction Analysis”
Author/Authors
Kacher، نويسنده , , Josh and Basinger، نويسنده , , Jay L. Adams ، نويسنده , , Brent L. and Fullwood، نويسنده , , David T.، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2010
Pages
3
From page
760
To page
762
Abstract
A reply to Maurice et al.ʹs comment on "Braggʹs Law Diffraction Simulations for Electron Backscatter Diffraction" is presented. A new method for microscope geometry calibration is briefly presented. Also, evidence that simple diffraction simulations can be profitable tools for absolute elastic strain measurements in crystalline materials is reiterated.
Keywords
Scanning electron microscope , strain , EBSD
Journal title
Ultramicroscopy
Serial Year
2010
Journal title
Ultramicroscopy
Record number
2157927
Link To Document