• Title of article

    Triple line diffusion in nanocrystalline Fe/Cr and its impact on thermal stability

  • Author/Authors

    Stender، نويسنده , , Patrick and Balogh، نويسنده , , Zoltan and Schmitz، نويسنده , , Guido، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 2011
  • Pages
    6
  • From page
    524
  • To page
    529
  • Abstract
    The thermal reaction of iron–chromium multilayers is analyzed by atom-probe tomography. Samples were prepared using ion-beam sputter deposition and cutting by focused ion beams. Isothermal and isochronal annealing sequences were carried out in a vacuum furnace. Effects of atomic transport are observed at temperatures above 773 K. Segregation along line-shaped zones is noticed to very high concentrations. These zones, with a diameter of 1.5 nm, are identified as triple lines of the grain structure. While these defects could not be resolved by TEM, the outstanding potential of a 3D analysis provided by APT allowed their detailed investigation. Evaluating the dependence of the segregation amplitude on time and temperature, the segregation enthalpy and diffusivity of the triple lines are quantified. The segregation enthalpy is determined to be 0.076 eV, which indicates the considerable excess volume at the triple line.
  • Keywords
    Atom-probe tomography , Triple lines , Triple junction , Multilayer , Chromium , Iron
  • Journal title
    Ultramicroscopy
  • Serial Year
    2011
  • Journal title
    Ultramicroscopy
  • Record number

    2158180