• Title of article

    On solving the orientation gradient dependency of high angular resolution EBSD

  • Author/Authors

    Maurice، نويسنده , , Claire and Driver، نويسنده , , Julian H. and Fortunier، نويسنده , , Roland، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 2012
  • Pages
    11
  • From page
    171
  • To page
    181
  • Abstract
    Current high angular resolution electron backscatter diffraction (HR-EBSD) methods are successful at measuring pure elastic strains but have difficulties with plastically deformed metals containing orientation gradients. The strong influences of these rotations have been systematically studied using simulated patterns based on the many-beam dynamic theory of EBSP formation; a rotation of only 1° can lead to apparent elastic strains of several hundred microstrains. A new method is proposed to correct for orientation gradient effects using a two-step procedure integrating finite strain theory: (i) reference pattern rotation and (ii) cross-correlation; it reduces the strain errors on the simulated patterns to tens of microstrains. An application to plastically deformed ferritic steel to generates elastic strain maps with significantly reduced values of both strains and residual errors in regions of rotations exceeding 1°.
  • Keywords
    Electron backscatter diffraction , Scanning electron microscopy , strain , cross-correlation , Plastic deformation , Orientation gradients
  • Journal title
    Ultramicroscopy
  • Serial Year
    2012
  • Journal title
    Ultramicroscopy
  • Record number

    2158498