Title of article
On solving the orientation gradient dependency of high angular resolution EBSD
Author/Authors
Maurice، نويسنده , , Claire and Driver، نويسنده , , Julian H. and Fortunier، نويسنده , , Roland، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2012
Pages
11
From page
171
To page
181
Abstract
Current high angular resolution electron backscatter diffraction (HR-EBSD) methods are successful at measuring pure elastic strains but have difficulties with plastically deformed metals containing orientation gradients. The strong influences of these rotations have been systematically studied using simulated patterns based on the many-beam dynamic theory of EBSP formation; a rotation of only 1° can lead to apparent elastic strains of several hundred microstrains. A new method is proposed to correct for orientation gradient effects using a two-step procedure integrating finite strain theory: (i) reference pattern rotation and (ii) cross-correlation; it reduces the strain errors on the simulated patterns to tens of microstrains. An application to plastically deformed ferritic steel to generates elastic strain maps with significantly reduced values of both strains and residual errors in regions of rotations exceeding 1°.
Keywords
Electron backscatter diffraction , Scanning electron microscopy , strain , cross-correlation , Plastic deformation , Orientation gradients
Journal title
Ultramicroscopy
Serial Year
2012
Journal title
Ultramicroscopy
Record number
2158498
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