• Title of article

    Impact of directional walk on atom probe microanalysis

  • Author/Authors

    Gault، نويسنده , , B. and Danoix، نويسنده , , F. and Hoummada، نويسنده , , K. and Mangelinck، نويسنده , , D. and Leitner، نويسنده , , H.، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 2012
  • Pages
    10
  • From page
    182
  • To page
    191
  • Abstract
    In the atom probe microanalysis of steels, inconsistencies in the measured compositions of solutes (C, N) have often been reported, as well as their appearance as molecular ions. Here we propose that these issues might arise from surface migration of solute atoms over the specimen surface. Surface migration of solutes is evidenced by field-ion microscopy observations, and its consequences on atom probe microanalysis are detailed for a wide range of solute (P, Si, Mn, B, C and N). It is proposed that directional walk driven by field gradients over the specimen surface and thermally activated is the prominent effect.
  • Keywords
    ARTEFACT , Surface migration , Atom probe tomography
  • Journal title
    Ultramicroscopy
  • Serial Year
    2012
  • Journal title
    Ultramicroscopy
  • Record number

    2158500