Title of article
Impact of directional walk on atom probe microanalysis
Author/Authors
Gault، نويسنده , , B. and Danoix، نويسنده , , F. and Hoummada، نويسنده , , K. and Mangelinck، نويسنده , , D. and Leitner، نويسنده , , H.، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2012
Pages
10
From page
182
To page
191
Abstract
In the atom probe microanalysis of steels, inconsistencies in the measured compositions of solutes (C, N) have often been reported, as well as their appearance as molecular ions. Here we propose that these issues might arise from surface migration of solute atoms over the specimen surface. Surface migration of solutes is evidenced by field-ion microscopy observations, and its consequences on atom probe microanalysis are detailed for a wide range of solute (P, Si, Mn, B, C and N). It is proposed that directional walk driven by field gradients over the specimen surface and thermally activated is the prominent effect.
Keywords
ARTEFACT , Surface migration , Atom probe tomography
Journal title
Ultramicroscopy
Serial Year
2012
Journal title
Ultramicroscopy
Record number
2158500
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