Title of article
Direct structure inversion from exit waves. Part II: A practical example
Author/Authors
Wang، نويسنده , , A. and Chen، نويسنده , , F.R. and Van Aert، نويسنده , , S. and Van Dyck، نويسنده , , D.، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2012
Pages
9
From page
77
To page
85
Abstract
This paper is the second part of a two-part paper on direct structure inversion from exit waves. In the first part, a method has been proposed to quantitatively determine structure parameters with atomic resolution such as atom column positions, surface profile and the number of atoms in the atom columns. In this part, the theory will be demonstrated by means of a Au[110] exit wave reconstructed from a set of focal-series images. The procedures to analyze the experimentally reconstructed exit wave in terms of quantitative structure information are described in detail.
Keywords
Channelling theory , structure determination , Argand plot , image processing , Electron scattering
Journal title
Ultramicroscopy
Serial Year
2012
Journal title
Ultramicroscopy
Record number
2158563
Link To Document