• Title of article

    Direct structure inversion from exit waves. Part II: A practical example

  • Author/Authors

    Wang، نويسنده , , A. and Chen، نويسنده , , F.R. and Van Aert، نويسنده , , S. and Van Dyck، نويسنده , , D.، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 2012
  • Pages
    9
  • From page
    77
  • To page
    85
  • Abstract
    This paper is the second part of a two-part paper on direct structure inversion from exit waves. In the first part, a method has been proposed to quantitatively determine structure parameters with atomic resolution such as atom column positions, surface profile and the number of atoms in the atom columns. In this part, the theory will be demonstrated by means of a Au[110] exit wave reconstructed from a set of focal-series images. The procedures to analyze the experimentally reconstructed exit wave in terms of quantitative structure information are described in detail.
  • Keywords
    Channelling theory , structure determination , Argand plot , image processing , Electron scattering
  • Journal title
    Ultramicroscopy
  • Serial Year
    2012
  • Journal title
    Ultramicroscopy
  • Record number

    2158563