Title of article
Selected-area diffraction and spectroscopy in LEEM and PEEM
Author/Authors
Tromp، نويسنده , , R.M.، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2012
Pages
5
From page
73
To page
77
Abstract
This paper addresses the effects of spherical and chromatic aberration of the objective lens, as well as chromatic dispersion of magnetic prism arrays, on the ability to perform selected area Low Energy Electron Diffraction, as well as (Angle Resolved) Photo Electron Spectroscopy experiments in todayʹs advanced cathode lens microscopy instruments.
Keywords
Selected area diffraction , LEEM , Selected area spectroscopy , PEEM , dispersion , Spherical aberration , Chromatic aberration
Journal title
Ultramicroscopy
Serial Year
2012
Journal title
Ultramicroscopy
Record number
2158636
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