Title of article
Detector non-uniformity in scanning transmission electron microscopy
Author/Authors
Findlay، نويسنده , , S.D. and LeBeau، نويسنده , , J.M.، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2013
Pages
9
From page
52
To page
60
Abstract
A non-uniform response across scanning transmission electron microscope annular detectors has been found experimentally, but is seldom incorporated into simulations. Through case study simulations, we establish the nature and scale of the discrepancies which may arise from failing to account for detector non-uniformity. If standard detectors are used at long camera lengths such that the detector is within or near to the bright field region, we find errors in contrast of the order of 10%, sufficiently small for qualitative work but non-trivial as experiments become more quantitative. In cases where the detector has been characterized in advance, we discuss the detector response normalization and how it may be incorporated in simulations.
Keywords
Detector efficiency. , High-angle annular dark field (HAADF) , Scanning transmission electron microscopy (STEM)
Journal title
Ultramicroscopy
Serial Year
2013
Journal title
Ultramicroscopy
Record number
2158698
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