Title of article
A new aberration-corrected, energy-filtered LEEM/PEEM instrument II. Operation and results
Author/Authors
Tromp، نويسنده , , R.M. and Hannon، نويسنده , , J.B. and Wan، نويسنده , , W. and Berghaus، نويسنده , , A. and Schaff، نويسنده , , O.، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2013
Pages
15
From page
25
To page
39
Abstract
In Part I we described a new design for an aberration-corrected Low Energy Electron Microscope (LEEM) and Photo Electron Emission Microscope (PEEM) equipped with an in-line electron energy filter. The chromatic and spherical aberrations of the objective lens are corrected with an electrostatic electron mirror that provides independent control of the chromatic and spherical aberration coefficients Cc and C3, as well as the mirror focal length. In this Part II we discuss details of microscope operation, how the microscope is set up in a systematic fashion, and we present typical results.
Journal title
Ultramicroscopy
Serial Year
2013
Journal title
Ultramicroscopy
Record number
2158912
Link To Document