Microstructure evolution in copper under severe plastic deformation detected by in situ X-ray diffraction using monochromatic synchrotron light

Microstructure evolution in severely deformed Cu has been investigated using high-energy synchrotron light during in situ high-pressure torsion (HPT) at room temperature. Relative changes in broadening of Bragg peaks and crystal lattice expansion were studied in the loading–unloading regime of torsion straining. Experimental results revealed fast relaxation (on the order of hundred of seconds) that occurred due to annihilation of HPT-induced crystal lattice defects, which were generated directly during deformation. The kinetics of relaxation is probably diffusion-controlled; therefore, the enhanced diffusivity can be explained by extremely high excess vacancy concentration, which is usually achieved at thermal equilibrium near the melting point.