Title of article
Scattering extraction of ions at CRYRING for SEU testing
Author/Authors
Novلk، نويسنده , , D. and Kerek، نويسنده , , A. and Klamra، نويسنده , , W. and Norlin، نويسنده , , L.-O. and Bagge، نويسنده , , L. and Kنllberg، نويسنده , , A. and Paلl، نويسنده , , A. and Rensfelt، نويسنده , , K.-G. and Molnلr، نويسنده , , J.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
5
From page
166
To page
170
Abstract
A measuring station has been built at the CRYRING heavy ion accelerator to test the Single Event Upset (SEU) phenomena in working Static RAM circuits. The setup extracts the beam using Rutherford scattering and the ions are monitored with a BaF2 scintillator. SEU measurements have been performed for standard bulk CMOS memory circuits.
Keywords
Single event upset , BaF2 scintillator , Beam extraction , Radiation hardness , Heavy ions
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
1999
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
2181733
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