Title of article
Time resolved X-ray micro-diffraction measurements of the dynamic local layer response to electric field in antiferroelectric liquid crystals
Author/Authors
Takahashi، نويسنده , , Yumiko and Iida، نويسنده , , Atuso and Takanishi، نويسنده , , Yoichi and Ogasawara، نويسنده , , Toyokazu and Takezoe، نويسنده , , Hideo، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
4
From page
1001
To page
1004
Abstract
The time-resolved synchrotron X-ray microbeam diffraction experiment has been carried out to reveal the local layer response to the electric field in the antiferroelectric liquid crystal. The X-ray microbeam of a few μm spatial resolution was obtained with Kirkpatrick–Baez optics. The time-resolved small angle diffraction experiment was performed with a time resolution ranging from 10 μs to a few ms. The reversible local layer change between the horizontal chevron and the quasi-bookshelf structure was confirmed by the triangular wave form. The transient layer response for the step form electric field was observed. The layer response closely related with an electric field induced antiferroelectric to ferroelectric phase transition.
Keywords
X-ray micro-diffraction , Synchrotron X-ray microbeam , Antiferroelectric liquid crystal , Time-resolved measurements
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
2001
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
2192189
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