Title of article
Measurement of synchrotron pulse durations using surface photovoltage transients
Author/Authors
Glover، نويسنده , , T.E. and Ackermann، نويسنده , , G.D. and Belkacem، نويسنده , , A. and Feinberg، نويسنده , , B. and Heimann، نويسنده , , P.A. and Hussain، نويسنده , , Z. and Padmore، نويسنده , , H.A. and Ray، نويسنده , , C. and Schoenlein، نويسنده , , R.W. and Steele، نويسنده , , W.F.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
3
From page
1438
To page
1440
Abstract
We report results on experiments using combined laser and synchrotron radiation. Picosecond laser pulses at 800 nm are used to induce surface photovoltage transients in p-type Si samples. A two-component decay is observed. The fast component of decay provides a direct measure of synchrotron soft X-ray pulse durations.
Keywords
X-ray pulse measurement , Combined laser-synchrotron spectroscopy
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
2001
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
2192293
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