• Title of article

    Jefferson Lab IR demo FEL photocathode quantum efficiency scanner

  • Author/Authors

    Gubeli، نويسنده , , J and Evans، نويسنده , , R and Grippo، نويسنده , , A and Jordan، نويسنده , , K and Shinn، نويسنده , , M and Siggins، نويسنده , , T، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2001
  • Pages
    5
  • From page
    554
  • To page
    558
  • Abstract
    Jefferson Laboratoryʹs Free Electron Laser (FEL) incorporates a cesiated gallium arsenide (GaAs) DC photocathode gun as its electron source. By using a set of scanning mirrors, the surface of the GaAs wafer is illuminated with a 543.5nm helium–neon laser. Measuring the current flow across the biased photocathode generates a quantum efficiency (QE) map of the 1-in. diameter wafer surface. The resulting QE map provides a very detailed picture of the efficiency of the wafer surface. By generating a QE map in a matter of minutes, the photocathode scanner has proven to be an exceptional tool in quickly determining sensitivity and availability of the photocathode for operation.
  • Keywords
    GaAs photocathode , Raster/scanner , Quantum efficiency
  • Journal title
    Nuclear Instruments and Methods in Physics Research Section A
  • Serial Year
    2001
  • Journal title
    Nuclear Instruments and Methods in Physics Research Section A
  • Record number

    2193382