Title of article
Single event effects in the pixel readout chip for BTeV
Author/Authors
Chiodini، نويسنده , , G and Appel، نويسنده , , J.A and Cardoso، نويسنده , , G and Christian، نويسنده , , D.C and Coluccia، نويسنده , , M.R and Hoff، نويسنده , , J and Kwan، نويسنده , , S.W and Mekkaoui، نويسنده , , A and Yarema، نويسنده , , R and Zimmermann، نويسنده , , S، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
6
From page
183
To page
188
Abstract
In future experiments the readout electronics for pixel detectors is required to be resistant to a very high radiation level. In this paper we report on irradiation tests performed on several preFPIX2 prototype pixel readout chips for the BTeV experiment exposed to a 200 MeV proton beam. The prototype chips have been implemented in commercial 0.25 μm CMOS processes following radiation tolerant design rules. The results show that this ASIC design tolerates a large total radiation dose, and that radiation induced Single Event Effects occur at a manageable level.
Keywords
Pixel detector , Radiation tolerance , Single Event Effects
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
2003
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
2197424
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