SEU rate estimates for the ATLAS/SCT front-end ASIC

We present a method of estimating the sensitivity to radiation-induced Single Event Upset (SEU) in the front-end ASICs for the ATLAS Semiconductor Tracker. The method is using ASICs of the final design with limited read-back possibilities of internal registers. Hence the measurement is adapted to utilise the event-data flow in the digital part of the ASIC to detect bit-flips. Furthermore, we report on the application of this method to estimate the SEU sensitivity. The results presented are based on data from three irradiation periods using prototype electronics hybrids and detector modules. The measurements were done with 24 GeV/c protons and 200 MeV/c pions.