Title of article
SEU studies of the upgraded Belle vertex detector front end electronics
Author/Authors
Korpar، نويسنده , , Samo and Krizan، نويسنده , , Peter and Fratina، نويسنده , , Sa?a، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
5
From page
195
To page
199
Abstract
The paper reports on a set of measurements which were carried out to test the influence of single event upset (SEU) effects on the performance of the VA1TA chip, the front end read-out electronics unit of the upgraded silicon vertex detector for the Belle spectrometer. In addition, the functionality of the SEU correction circuits in the chip were examined.
Keywords
Single Event Effects (SEE) , Single Event Upset (SEU) , Latch-up , Microstrip silicon vertex detectors , Read-out electronics
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
2003
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
2200262
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