• Title of article

    Challenges and benefits of designing readout ASICs in advanced technologies

  • Author/Authors

    Dabrowski، نويسنده , , W.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2007
  • Pages
    7
  • From page
    821
  • To page
    827
  • Abstract
    Basic trends in scaling CMOS technologies are reviewed briefly putting emphasis on advantages and limitations to designing readout ASIC. Scaling of noise performance in deep submicron MOSFETs is discussed in context of application in front-end circuits. A comparison of noise performance in deep submicron MOS transistors and in bipolar transistors is presented. Scaling of matching performance is reviewed and impacts on designing analogue circuits are discussed. Design challenges for mixed-signal ASICs related to analogue modelling, substrate coupling of digital noise, speed vs. power optimisation are reviewed briefly. Radiation effects in deep submicron CMOS technologies are reviewed and radiation hardening strategy towards Super LHC applications is discussed.
  • Keywords
    CMOS scaling , Low voltage design , Radiation effects , Deep submicron CMOS processes , Low noise design , Front-end electronics , Application-specific integrated circuits
  • Journal title
    Nuclear Instruments and Methods in Physics Research Section A
  • Serial Year
    2007
  • Journal title
    Nuclear Instruments and Methods in Physics Research Section A
  • Record number

    2207196