A compact X-ray tomograph based on a CMOS flat panel

Computed-assisted tomography is widely used in industrial non-destructive testing and in several research areas. A must of the tomographic equipment is often the speed of acquisition of the radiographs. When energy resolution is not a problem, an area detector can be used and a fast acquisition can be obtained. There are several kinds of area detectors, but if it is important to analyze relative large samples, the choice is restricted to some flat panels. In this paper, we describe a prototype of a tomographic equipment based on a CMOS area detector. This detector works at room temperature and permits to analyze samples as large as 10 cm with a spatial resolution of 50 μm. Preliminary results are reported here.