Title of article
Plastically deformed Si-crystal wafers for neutron-monochromator elements
Author/Authors
Hiraka، نويسنده , , H. and Fujiwara، نويسنده , , K. and Yamada، نويسنده , , K. and Morishita، نويسنده , , K. and Nakajima، نويسنده , , K.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2011
Pages
4
From page
137
To page
140
Abstract
Plastically deformed Si-crystal wafers were characterized by monochromatic neutron diffraction. During the cylindrically curved deformation, a resolution-limit Bragg peak changes into a box-type angular profile in accordance with the bulk curvature, associated with an enhancement in the angle-integrated intensity ( I θ ). Stacking such wafers is efficient in amplifying I θ further. We propose an application to neutron-focusing monochromator (or analyzer) crystals in order to design a quite compact spectrometer.
Keywords
Plastically deformed Si wafer , Neutron monochromator , neutron reflectivity , Mosaic crystal
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
2011
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
2208138
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