Title of article
Development of an advanced X-ray detector for inspecting inner microscopic structural details in industrial applications
Author/Authors
Han، نويسنده , , Yueping and Han، نويسنده , , Yan and Li، نويسنده , , Ruihong and Li، نويسنده , , Haiting، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2009
Pages
5
From page
440
To page
444
Abstract
A new charge coupled device (CCD)-based X-ray detector, which uses a high-gain microchannel plate image intensifier for upfront optical gain, is proposed. The intensifier is directly coupled with the photosensitive surface of a CCD by a fiber optic taper and acts as both a converter and intensifier. Experimental results for the detector in X-ray imaging show that the detector currently has an intrinsic resolution of approximately 83 μm (12 lp/mm).
Keywords
CCD-based X-ray detector , High spatial resolution , x-ray imaging
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
2009
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
2210812
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