Title of article
Synchrotron-based photoelectron microscopy
Author/Authors
Barinov، نويسنده , , Alexei and Dudin، نويسنده , , Pavel and Gregoratti، نويسنده , , Luca and Locatelli، نويسنده , , Andrea and Onur Mente?، نويسنده , , Tevfik and ?ngel Ni?o، نويسنده , , Miquel and Kiskinova، نويسنده , , Maya، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2009
Pages
8
From page
195
To page
202
Abstract
The paper is a brief overview of the operation principles and the potentials of the scanning photoelectron microscopes (SPEM) and X-ray photoemission electron microscopes (XPEEM) operating at synchrotron facilities. Selected results will illustrate the impact of high spatial resolution for micro-characterization of the surface composition and electronic structure, a key issue for analysis of technologically relevant materials and for fundamental understanding of many unexplored surface phenomena.
Keywords
Interfaces , Nanostructures , X-ray photoemission electron microscopy , surfaces , surface reactions , Scanning photoelectron microscopy
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
2009
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
2210863
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