X-ray digital wavefront sensor development

Phase contrast imaging (PCI) is a wavefront sensing method that uses a series of intensity images to reconstruct the wavefront. The lateral resolution of PCI is limited mainly by the resolution of the intensity images. PCI provides a simple and efficient technique for characterizing X-ray mirrors. A simulation experiment was conducted to demonstrate the performances of PCI. The results of these experiments have shown the feasibility and potential performances of this method. The use of phase retrieval presents opportunities for greatly simplifying the techniques and apparatus used for characterizing optical surfaces and systems, particularly aspherical surfaces. This paper addresses the design, implementation and performances of an integrated at wavelength digital wavefront sensor.