Title of article
A new FESEM procedure for assessment of XRD microstructural data of kaolinites
Author/Authors
Clausell، نويسنده , , J.V. and Bastida، نويسنده , , J. and Serrano، نويسنده , , F.J. and Pardo، نويسنده , , P. and Huertas، نويسنده , , F.J.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2007
Pages
6
From page
127
To page
132
Abstract
A sample preparation method for FESEM microstructural analysis of sheet silicates using oriented aggregates on metallic strips parallel to the electronic beam is described. The method allows the easy measurement of thickness of kaolinite crystallites. The results have been compared to the apparent crystallite size measured by XRD The performed measurements for a set of selected kaolinites are in the range 15–60 nm and show a good correlation with XRD crystallite thickness (in the range 11–48 nm) obtained by the Voigt function method.
Keywords
Microstructural analysis , Kaolinite , Crystallite size , FESEM
Journal title
Applied Clay Science:an International Journal on the Application...
Serial Year
2007
Journal title
Applied Clay Science:an International Journal on the Application...
Record number
2221839
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