• Title of article

    Fatigue and retention properties of Bi3.25La0.75Ti3O12 films using LaNiO3 bottom electrodes

  • Author/Authors

    Simُes، نويسنده , , A.Z. and Aguiar، نويسنده , , E.C. and Riccardi، نويسنده , , C.S. and Longo، نويسنده , , E. and Varela، نويسنده , , J.A.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2009
  • Pages
    4
  • From page
    353
  • To page
    356
  • Abstract
    Fatigue-free Bi3.25La0.75Ti3O12 (BLT) thin films were grown on LaNiO3 bottom electrodes grown in a microwave furnace at 700 °C for 10 min from the polymeric precursor method. It was found that LaNiO3 (LNO) bottom electrode with pseudocubic structure strongly promote the formation of (00l) texture of BLT films. The remanent polarization (Pr) and the drive voltage (Vc) were 11 μC/cm2 and 1.3 V respectively, and are better than the values found in the literature. The polarization of the Au/BLT/LNO/SiO2/Si (100) capacitors with a thickness of 280 nm exhibited no degradation after 1 × 1010 switching cycles at an applied voltage of 5 V with a frequency of 1 MHz. After several tests the capacitors retain 77% of its polarization upon a retention time of 104 s.
  • Keywords
    Thin films , Microwave furnace , Bottom electrode , Capacitor , Retention
  • Journal title
    Materials Characterization
  • Serial Year
    2009
  • Journal title
    Materials Characterization
  • Record number

    2267284