Title of article
Fatigue and retention properties of Bi3.25La0.75Ti3O12 films using LaNiO3 bottom electrodes
Author/Authors
Simُes، نويسنده , , A.Z. and Aguiar، نويسنده , , E.C. and Riccardi، نويسنده , , C.S. and Longo، نويسنده , , E. and Varela، نويسنده , , J.A.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2009
Pages
4
From page
353
To page
356
Abstract
Fatigue-free Bi3.25La0.75Ti3O12 (BLT) thin films were grown on LaNiO3 bottom electrodes grown in a microwave furnace at 700 °C for 10 min from the polymeric precursor method. It was found that LaNiO3 (LNO) bottom electrode with pseudocubic structure strongly promote the formation of (00l) texture of BLT films. The remanent polarization (Pr) and the drive voltage (Vc) were 11 μC/cm2 and 1.3 V respectively, and are better than the values found in the literature. The polarization of the Au/BLT/LNO/SiO2/Si (100) capacitors with a thickness of 280 nm exhibited no degradation after 1 × 1010 switching cycles at an applied voltage of 5 V with a frequency of 1 MHz. After several tests the capacitors retain 77% of its polarization upon a retention time of 104 s.
Keywords
Thin films , Microwave furnace , Bottom electrode , Capacitor , Retention
Journal title
Materials Characterization
Serial Year
2009
Journal title
Materials Characterization
Record number
2267284
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