Title of article
Application of atomic force microscopy in determining the fractal dimension of the mirror, mist, and hackle region of silica glass
Author/Authors
Smith، نويسنده , , R.L. and Mecholsky Jr.، نويسنده , , J.J.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2011
Pages
6
From page
457
To page
462
Abstract
Fractal analysis has been used as a method to study fracture surfaces of brittle materials. However, it has not been determined if the fractal characteristics of brittle materials is consistent throughout the fracture surface. Therefore, the fractal dimensional increment of the mirror, mist, and hackle regions of the fracture surface of silica glass was determined using atomic force microscopy. The fractal dimensional increment of the mirror region (0.17–0.26) was determined to be statistically greater than that for the mist (0.08–0.12) and hackle (0.08–0.13) regions. It is thought that the increase in the fractal dimensional increment is caused by a greater tortuosity in the mirror region due to, most likely, the slower crack velocity of the propagating crack in that region and that there is a point between the mirror and mist region at which the fractal dimension decreases and becomes constant.
Keywords
Slit-island , Roughness exponent , Soda-lime-silica glass , Scanning probe microscopy
Journal title
Materials Characterization
Serial Year
2011
Journal title
Materials Characterization
Record number
2268173
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