• Title of article

    Microstructure and texture evolution of Cu–Nb composite wires

  • Author/Authors

    Deng، نويسنده , , Liping and Yang، نويسنده , , Xiaofang and Han، نويسنده , , Ke and Lu، نويسنده , , Yafeng and Liang، نويسنده , , Ming and Liu، نويسنده , , Qing، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2013
  • Pages
    10
  • From page
    124
  • To page
    133
  • Abstract
    The evolution of microstructure and texture in Cu–Nb composite wires fabricated by an accumulative drawing and bundling process was investigated by backscattered electron (BSE), electron backscatter diffraction (EBSD) and transmission electron microscopy (TEM). Results indicate the onset of severe curling and shape changing occurred at the size of Nb ~ 400 nm with a surface increase of about 6.91 μm2/μm3 (the area per unit volume). Two kinds of grain boundaries in Nb are suggested: one is 20°–50° boundary with a rotate/tilt axis around <110> parallel to drawing direction (DD), and another is > 50° boundary with the axis perpendicular to DD. The curling phenomenon occurred at the Cu–Nb interface and is related not only to the deformation mechanism of Nb but also to the presence of interface. This result is distinct from reported works showing that curling takes place when BCC metals are heavily drawn (Area reduction > 73%). The variation in microstructure and texture evolution between Cu and Nb filaments was discussed based on the differences in deformation mechanisms of these two metals.
  • Keywords
    Transmission electron microscopy , Cu–Nb composite , microstructure , Texture , Electron backscatter diffraction
  • Journal title
    Materials Characterization
  • Serial Year
    2013
  • Journal title
    Materials Characterization
  • Record number

    2268883