Title of article
Nano fabrication of star structure for precision metrology developed by focused ion beam direct writing
Author/Authors
Xu، نويسنده , , Zongwei and Fang، نويسنده , , Fengzhou and Gao، نويسنده , , Haifeng and Zhu، نويسنده , , Yibo and Wu، نويسنده , , Wei and Weckenmann، نويسنده , , Albert، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2012
Pages
4
From page
511
To page
514
Abstract
The optimized design and nano fabrication of the star structures with continuous-variation spoke width are investigated in this study. Focused ion beam direct writing (FIBDW) technology is employed to fabricate the stars on various materials with an application-oriented design. The star center dimension and surface finish are minimized. The star structures with spokeʹs width ranging from 25 nm to 16 μm and step height from 1 nm to 1 μm are achieved precisely. optical microscopy, scanning probe microscopy and scanning electronic microscopy are used to test their measurement capabilities based on the developed star structures in lateral and longitudinal directions, respectively.
Keywords
Metrology , Ion beam machining (IBM) , Interferometry
Journal title
CIRP Annals - Manufacturing Technology
Serial Year
2012
Journal title
CIRP Annals - Manufacturing Technology
Record number
2269641
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